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SN74BCT8374ADWR TI IC SCAN TEST DEVICE W/FF 24-SOIC
SN74BCT8374ADWR Images
SN74BCT8374ADWR Images
SN74BCT8374ADWR
  • Manufacturer: Texas Instruments (TI)
  • Category: Integrated Circuits (ICs)~Logic - Specialty Logic Package/Case: 24-SOIC (0.295, 7.50mm Width)
  • Description: IC SCAN TEST DEVICE W/FF 24-SOIC
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Download Datasheet (PDF)
SN74BCT8374ADWR Datasheet
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SN74BCT8374ADWR Specifications:
  • MfrPart.: SN74BCT8374ADWR
  • Mfr: Texas Instruments
  • Description: IC SCAN TEST DEVICE W/FF 24-SOIC
  • Product Category: Integrated Circuits (ICs)~Logic - Specialty Logic
  • Package: Tape & Reel (TR)
  • Series: 74BCT
  • PartStatus: Obsolete
  • LogicType: Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • SupplyVoltage: 4.5V ~ 5.5V
  • NumberofBits: 8
  • OperatingTemperature: 0°C ~ 70°C
  • MountingType: Surface Mount
  • Package/Case: 24-SOIC (0.295, 7.50mm Width)
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SN74BCT8374ADWR, TI authentic parts in stock from TI authorized distributors, order today, can ship immediately.
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