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SN74BCT8373ANT TI IC SCAN TEST DEVICE LATCH 24-DIP
SN74BCT8373ANT Images
SN74BCT8373ANT Images
  • Manufacturer: Texas Instruments (TI)
  • Category: Integrated Circuits (ICs)~Logic - Specialty Logic Package/Case: 24-DIP (0.300, 7.62mm)
  • Description: IC SCAN TEST DEVICE LATCH 24-DIP
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Download Datasheet (PDF)
SN74BCT8373ANT Datasheet
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SN74BCT8373ANT Specifications:
  • MfrPart.: SN74BCT8373ANT
  • Mfr: Texas Instruments
  • Description: IC SCAN TEST DEVICE LATCH 24-DIP
  • Product Category: Integrated Circuits (ICs)~Logic - Specialty Logic
  • Package: Tube
  • Series: 74BCT
  • PartStatus: Obsolete
  • LogicType: Scan Test Device with D-Type Latches
  • SupplyVoltage: 4.5V ~ 5.5V
  • NumberofBits: 8
  • OperatingTemperature: 0°C ~ 70°C
  • MountingType: Through Hole
  • Package/Case: 24-DIP (0.300, 7.62mm)
  • SN74BCT8373ANT TI, IC SCAN TEST DEVICE LATCH 24-DIP, Integrated Circuits (ICs)~Logic - Specialty Logic
SN74BCT8373ANT, TI authentic parts in stock from TI authorized distributors, order today, can ship immediately.
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